Call for Papers

IEEE Workshop on Optical and Electromagnetic Characteristics and

 its Applications


The 2015 Smart World Congress

August 10-14, 2015, Beijing, China


Workshop on Optical and Electromagnetic Characteristics and its Applications consist of optical and electromagnetic. The optical characteristics by radiation or scattering are very active subfields of optic detect system research. The electromagnetic (EM) characteristics of targets and environments are very active subfields of the radar research. The Optical and Electromagnetic Characteristics and its Applications will serve as a meeting point for researchers working on Optic Modeling and Simulation, Measurement Techniques, Data Processing, Detection and Recognition Techniques, EM Scattering Modeling and Measurement, Target Detection and Recognition in Complex Environments, Microwave and Terahertz Imaging , etc. It also aims at stimulating communications and exchanges between research institution workers and academic experts, industrial research institution workers and academic experts.

Topics of Interests

Novel papers are invited from academic and research institutions, describing intriguing phenomena, original results, new technical implementations, or in-depth user studies, including but not limited to, the following:

Modeling and Simulation

Optic Measurement Techniques

Optic Characteristics of Materials

Atmosphere Propagation

Laser Scattering

Optic Sensor Simulation and Evaluation

Image Processing

Hyperspectral Data Pre- and Post- Processing

Target Detection and Recognition

EM Scattering Modeling

Computational Electromagnetics

Microwave Imaging

EM Scattering Measurement

Radar Cross Section Reduction

Terahertz Scattering and Imaging

EM Scattering in Complex Random Media

EM Scattering from the Targets in Complex Environment

Target Recognition

Inverse Scattering

Submission Guidelines

Authors are invited to submit papers (IEEE standard format, max 6 pages). The IEEE templates can be found at: All submissions should be written in English, the PDF file of your paper should be sent to:

All papers will be reviewed by the Program Committee, which will assess significance, originality, accuracy, and clarity. Accepted papers will be published in proceedings of the 2015 Smart World Congress by IEEE Computer Society (EI indexed). Extended versions of selected best papers will be considered for publication in special issues of several SCIE-indexed international journals.

Important dates:

Submission deadline:  May 10, 2015

Authors’ Notification:  May 20, 2015

Camera-ready due:  June 5, 2015

General Chair:

Zhihe Xiao

Zhongling Liu

Yongjun Xie

Technical Program Members:

Junwen Chen

Hongcheng Yin

Xiangyang Zhang

Gengxing Xu

Jingjiao Liu

Bing Zhang

Pucai Wang

Jindong Fei

Yanbing Dong

Zhenfu Zhu

Rong Deng

Junwei Li 

Local coordinators :

Gao Jie, 13810458433